Karim Arabi, Bozena Kaminska and Janusz Rzeszut
Paper (1994)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/33608/ |
| Conference Title: | 3rd Asian Test Symposium |
| Conference Location: | Nara, Japon |
| Conference Date(s): | 1994-11-15 - 1994-11-17 |
| Publisher: | IEEE |
| DOI: | 10.1109/ats.1994.367203 |
| Official URL: | https://doi.org/10.1109/ats.1994.367203 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 08 Apr 2025 06:54 |
| Cite in APA 7: | Arabi, K., Kaminska, B., & Rzeszut, J. (1994, November). Built-in self-test approach for medium to high-resolution digital-to-analog converters [Paper]. 3rd Asian Test Symposium, Nara, Japon. https://doi.org/10.1109/ats.1994.367203 |
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