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Built-in self-test approach for medium to high-resolution digital-to-analog converters

Karim Arabi, Bozena Kaminska and Janusz Rzeszut

Paper (1994)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/33608/
Conference Title: 3rd Asian Test Symposium
Conference Location: Nara, Japon
Conference Date(s): 1994-11-15 - 1994-11-17
Publisher: IEEE
DOI: 10.1109/ats.1994.367203
Official URL: https://doi.org/10.1109/ats.1994.367203
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:24
Cite in APA 7: Arabi, K., Kaminska, B., & Rzeszut, J. (1994, November). Built-in self-test approach for medium to high-resolution digital-to-analog converters [Paper]. 3rd Asian Test Symposium, Nara, Japon. https://doi.org/10.1109/ats.1994.367203

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