Karim Arabi, Bozena Kaminska and Janusz Rzeszut
Paper (1994)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/33607/ |
| Conference Title: | IEEE/ACM International Conference on Computer-Aided Design |
| Conference Location: | San Jose, CA, USA |
| Conference Date(s): | 1994-11-06 - 1994-11-10 |
| Journal Title: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
| Publisher: | IEEE |
| DOI: | 10.1109/iccad.1994.629860 |
| Official URL: | https://doi.org/10.1109/iccad.1994.629860 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 25 Sep 2024 16:16 |
| Cite in APA 7: | Arabi, K., Kaminska, B., & Rzeszut, J. (1994, November). New built-in self-test approach for digital-to-analog and analog-to-digital converters [Paper]. IEEE/ACM International Conference on Computer-Aided Design, San Jose, CA, USA. Published in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. https://doi.org/10.1109/iccad.1994.629860 |
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