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New built-in self-test approach for digital-to-analog and analog-to-digital converters

Karim Arabi, Bozena Kaminska and Janusz Rzeszut

Paper (1994)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/33607/
Conference Title: IEEE/ACM International Conference on Computer-Aided Design
Conference Location: San Jose, CA, USA
Conference Date(s): 1994-11-06 - 1994-11-10
Journal Title: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Publisher: IEEE
DOI: 10.1109/iccad.1994.629860
Official URL: https://doi.org/10.1109/iccad.1994.629860
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:24
Cite in APA 7: Arabi, K., Kaminska, B., & Rzeszut, J. (1994, November). New built-in self-test approach for digital-to-analog and analog-to-digital converters [Paper]. IEEE/ACM International Conference on Computer-Aided Design, San Jose, CA, USA. Published in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. https://doi.org/10.1109/iccad.1994.629860

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