Naim Ben Hamida and Bozena Kaminska
Paper (1994)
An external link is available for this item
| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/33239/ |
| Conference Title: | 7th International Conference on VLSI Design |
| Conference Location: | Calcutta, India |
| Conference Date(s): | 1994-01-05 - 1994-01-08 |
| Publisher: | IEEE |
| DOI: | 10.1109/icvd.1994.282657 |
| Official URL: | https://doi.org/10.1109/icvd.1994.282657 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 25 Sep 2024 16:15 |
| Cite in APA 7: | Hamida, N. B., & Kaminska, B. (1994, January). Multiple fault testing in analog circuits [Paper]. 7th International Conference on VLSI Design, Calcutta, India. https://doi.org/10.1109/icvd.1994.282657 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
