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Multiple fault testing in analog circuits

Naim Ben Hamida and Bozena Kaminska

Paper (1994)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/33239/
Conference Title: 7th International Conference on VLSI Design
Conference Location: Calcutta, India
Conference Date(s): 1994-01-05 - 1994-01-08
Publisher: IEEE
DOI: 10.1109/icvd.1994.282657
Official URL: https://doi.org/10.1109/icvd.1994.282657
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:24
Cite in APA 7: Hamida, N. B., & Kaminska, B. (1994, January). Multiple fault testing in analog circuits [Paper]. 7th International Conference on VLSI Design, Calcutta, India. https://doi.org/10.1109/icvd.1994.282657

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