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Sputtered silicate-limit NASICON thin films for electrochemical sensors

Dentcho Ivanov, John F. Currie, H. Bouchard, A. Lecours, J. Andrian, Arthur Yelon and Suzie Poulin

Article (1994)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/33199/
Journal Title: Solid State Ionics (vol. 67, no. 3-4)
Publisher: Elsevier
DOI: 10.1016/0167-2738(94)90020-5
Official URL: https://doi.org/10.1016/0167-2738%2894%2990020-5
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:24
Cite in APA 7: Ivanov, D., Currie, J. F., Bouchard, H., Lecours, A., Andrian, J., Yelon, A., & Poulin, S. (1994). Sputtered silicate-limit NASICON thin films for electrochemical sensors. Solid State Ionics, 67(3-4), 295-299. https://doi.org/10.1016/0167-2738%2894%2990020-5

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