<  Back to the Polytechnique Montréal portal

Data path testability evaluation via functional testability measures

Mohamed Jamoussi and Bozena Kaminska

Paper (1994)

An external link is available for this item
Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/33193/
Conference Title: 7th International Conference on VLSI Design
Conference Location: Calcutta, India
Conference Date(s): 1994-01-05 - 1994-01-08
Publisher: IEEE
DOI: 10.1109/icvd.1994.282707
Official URL: https://doi.org/10.1109/icvd.1994.282707
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:24
Cite in APA 7: Jamoussi, M., & Kaminska, B. (1994, January). Data path testability evaluation via functional testability measures [Paper]. 7th International Conference on VLSI Design, Calcutta, India. https://doi.org/10.1109/icvd.1994.282707

Statistics

Dimensions

Repository Staff Only

View Item View Item