Mohamed Jamoussi and Bozena Kaminska
Paper (1994)
An external link is available for this itemAdditional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
ISBN: | 0818649909 |
PolyPublie URL: | https://publications.polymtl.ca/33193/ |
Conference Title: | 7th International Conference on VLSI Design |
Conference Location: | Calcutta, India |
Conference Date(s): | 1994-01-05 - 1994-01-08 |
Publisher: | IEEE |
DOI: | 10.1109/icvd.1994.282707 |
Official URL: | https://doi.org/10.1109/icvd.1994.282707 |
Date Deposited: | 18 Apr 2023 15:25 |
Last Modified: | 08 Apr 2025 06:54 |
Cite in APA 7: | Jamoussi, M., & Kaminska, B. (1994, January). Data path testability evaluation via functional testability measures [Paper]. 7th International Conference on VLSI Design, Calcutta, India. https://doi.org/10.1109/icvd.1994.282707 |
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