Mohamed Jamoussi and Bozena Kaminska
Paper (1994)
An external link is available for this item
| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| ISBN: | 0818649909 |
| PolyPublie URL: | https://publications.polymtl.ca/33193/ |
| Conference Title: | 7th International Conference on VLSI Design |
| Conference Location: | Calcutta, India |
| Conference Date(s): | 1994-01-05 - 1994-01-08 |
| Publisher: | IEEE |
| DOI: | 10.1109/icvd.1994.282707 |
| Official URL: | https://doi.org/10.1109/icvd.1994.282707 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 08 Apr 2025 06:54 |
| Cite in APA 7: | Jamoussi, M., & Kaminska, B. (1994, January). Data path testability evaluation via functional testability measures [Paper]. 7th International Conference on VLSI Design, Calcutta, India. https://doi.org/10.1109/icvd.1994.282707 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
