Mustapha Slamani and Bozena Kaminska
Paper (1994)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/32844/ |
| Conference Title: | 12th IEEE VLSI Test Symposium |
| Conference Location: | Cherry Hill, NJ, USA |
| Conference Date(s): | 1994-04-25 - 1994-04-28 |
| Publisher: | IEEE |
| DOI: | 10.1109/vtest.1994.292334 |
| Official URL: | https://doi.org/10.1109/vtest.1994.292334 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 25 Sep 2024 16:15 |
| Cite in APA 7: | Slamani, M., & Kaminska, B. (1994, April). Multifrequency testability analysis for analog circuits [Paper]. 12th IEEE VLSI Test Symposium, Cherry Hill, NJ, USA. https://doi.org/10.1109/vtest.1994.292334 |
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