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Multifrequency testability analysis for analog circuits

Mustapha Slamani and Bozena Kaminska

Paper (1994)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/32844/
Conference Title: 12th IEEE VLSI Test Symposium
Conference Location: Cherry Hill, NJ, USA
Conference Date(s): 1994-04-25 - 1994-04-28
Publisher: IEEE
DOI: 10.1109/vtest.1994.292334
Official URL: https://doi.org/10.1109/vtest.1994.292334
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:23
Cite in APA 7: Slamani, M., & Kaminska, B. (1994, April). Multifrequency testability analysis for analog circuits [Paper]. 12th IEEE VLSI Test Symposium, Cherry Hill, NJ, USA. https://doi.org/10.1109/vtest.1994.292334



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