Mustapha Slamani, Bozena Kaminska and Guy Quesnel
Paper (1994)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/32843/ |
| Conference Title: | 1994 IEEE International Test Conference |
| Conference Location: | Washington, DC, USA |
| Conference Date(s): | 1994-10-02 - 1994-10-06 |
| Publisher: | IEEE |
| DOI: | 10.1109/test.1994.528008 |
| Official URL: | https://doi.org/10.1109/test.1994.528008 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 25 Sep 2024 16:15 |
| Cite in APA 7: | Slamani, M., Kaminska, B., & Quesnel, G. (1994, October). Integrated approach for analog circuit testing with a minimum number of detected parameters [Paper]. 1994 IEEE International Test Conference, Washington, DC, USA. https://doi.org/10.1109/test.1994.528008 |
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