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Integrated approach for analog circuit testing with a minimum number of detected parameters

Mustapha Slamani, Bozena Kaminska and Guy Quesnel

Paper (1994)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/32843/
Conference Title: 1994 IEEE International Test Conference
Conference Location: Washington, DC, USA
Conference Date(s): 1994-10-02 - 1994-10-06
Publisher: IEEE
DOI: 10.1109/test.1994.528008
Official URL: https://doi.org/10.1109/test.1994.528008
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:23
Cite in APA 7: Slamani, M., Kaminska, B., & Quesnel, G. (1994, October). Integrated approach for analog circuit testing with a minimum number of detected parameters [Paper]. 1994 IEEE International Test Conference, Washington, DC, USA. https://doi.org/10.1109/test.1994.528008

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