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Application of optoelectronic techniques to high speed testing

Ewa Sokolowska and Bozena Kaminska

Paper (1994)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/32841/
Conference Title: 1994 IEEE International Test Conference
Conference Location: Washington, DC, USA
Conference Date(s): 1994-10-02 - 1994-10-06
Publisher: IEEE
DOI: 10.1109/test.1994.528017
Official URL: https://doi.org/10.1109/test.1994.528017
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:23
Cite in APA 7: Sokolowska, E., & Kaminska, B. (1994, October). Application of optoelectronic techniques to high speed testing [Paper]. 1994 IEEE International Test Conference, Washington, DC, USA. https://doi.org/10.1109/test.1994.528017

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