B. Ayari, N. Ben Hamida and Bozena Kaminska
Paper (1995)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/32618/ |
| Conference Title: | European Conference on Design and Test (EDTC 1995) |
| Conference Location: | Paris, France |
| Conference Date(s): | 1995-03-06 - 1995-03-09 |
| Publisher: | IEEE Comput. Soc. Press |
| DOI: | 10.1109/edtc.1995.470320 |
| Official URL: | https://doi.org/10.1109/edtc.1995.470320 |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 25 Sep 2024 16:15 |
| Cite in APA 7: | Ayari, B., Ben Hamida, N., & Kaminska, B. (1995, March). Automatic test vector generation for mixed-signal circuits [Paper]. European Conference on Design and Test (EDTC 1995), Paris, France. https://doi.org/10.1109/edtc.1995.470320 |
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