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Automatic test vector generation for mixed-signal circuits

B. Ayari, N. Ben Hamida and Bozena Kaminska

Paper (1995)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/32618/
Conference Title: European Conference on Design and Test (EDTC 1995)
Conference Location: Paris, France
Conference Date(s): 1995-03-06 - 1995-03-09
Publisher: IEEE Comput. Soc. Press
DOI: 10.1109/edtc.1995.470320
Official URL: https://doi.org/10.1109/edtc.1995.470320
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:23
Cite in APA 7: Ayari, B., Ben Hamida, N., & Kaminska, B. (1995, March). Automatic test vector generation for mixed-signal circuits [Paper]. European Conference on Design and Test (EDTC 1995), Paris, France. https://doi.org/10.1109/edtc.1995.470320

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