Saab Khaled, Bozena Kaminska, Bernard Courtois and Marcelo Lubaszewski
Paper (1995)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/32099/ |
| Conference Title: | 13th IEEE VLSI Test Symposium |
| Conference Location: | Princeton, NJ, USA |
| Conference Date(s): | 1995-04-30 - 1995-05-03 |
| Publisher: | IEEE |
| DOI: | 10.1109/vtest.1995.512617 |
| Official URL: | https://doi.org/10.1109/vtest.1995.512617 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 08 Apr 2025 06:52 |
| Cite in APA 7: | Khaled, S., Kaminska, B., Courtois, B., & Lubaszewski, M. (1995, April). Frequency-based BIST for analog circuit testing [Paper]. 13th IEEE VLSI Test Symposium, Princeton, NJ, USA. https://doi.org/10.1109/vtest.1995.512617 |
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