Noise measurements of microwave transistors using an uncalibrated mechanical stub tuner and a built-in reverse six-port reflectometer

Di-Luân Lê and Fadhel M. Ghannouchi

Article (1995)

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Additional Information:	Nom historique du département: Département de génie électrique et de génie informatique
Department:	Department of Electrical Engineering Department of Computer Engineering and Software Engineering
PolyPublie URL:	https://publications.polymtl.ca/32031/
Journal Title:	IEEE Transactions on Instrumentation and Measurement (vol. 44, no. 4)
Publisher:	Institute of Electrical and Electronics Engineers
DOI:	10.1109/19.392869
Official URL:	https://doi.org/10.1109/19.392869
Date Deposited:	18 Apr 2023 15:25
Last Modified:	08 Apr 2025 06:52

Cite in APA 7:	Lê, D.-L., & Ghannouchi, F. M. (1995). Noise measurements of microwave transistors using an uncalibrated mechanical stub tuner and a built-in reverse six-port reflectometer. IEEE Transactions on Instrumentation and Measurement, 44(4), 847-852. https://doi.org/10.1109/19.392869
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