Jean-Jacques Laurin
, Gael Tanneau and Cevdet Akyel
Article (1996)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| Research Center: | POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics |
| PolyPublie URL: | https://publications.polymtl.ca/31130/ |
| Journal Title: | IEEE Transactions on Instrumentation and Measurement (vol. 45, no. 1) |
| Publisher: | IEEE |
| DOI: | 10.1109/19.481351 |
| Official URL: | https://doi.org/10.1109/19.481351 |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 08 Apr 2025 06:51 |
| Cite in APA 7: | Laurin, J.-J., Tanneau, G., & Akyel, C. (1996). Waveguide permittivity measurement using variable-length samples and an uncalibrated reflectometer. IEEE Transactions on Instrumentation and Measurement, 45(1), 298-301. https://doi.org/10.1109/19.481351 |
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