Karim Arabi and Bozena Kaminska
Article (1997)
An external link is available for this item| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/30710/ |
| Journal Title: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (vol. 16, no. 7) |
| Publisher: | IEEE |
| DOI: | 10.1109/43.644035 |
| Official URL: | https://doi.org/10.1109/43.644035 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 08 Apr 2025 02:21 |
| Cite in APA 7: | Arabi, K., & Kaminska, B. (1997). Testing analog and mixed-signal integrated circuits using oscillation-test method. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 16(7), 745-753. https://doi.org/10.1109/43.644035 |
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