A. Hammache, Gilles Brassard, Michel A. Bouchard
, F. Beauregard, Cevdet Akyel and Fadhel M. Ghannouchi
Paper (1997)
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| Additional Information: |
Nom historique du département: Département de génie électrique et de génie informatique; Nom historique du département: Département de géologie (Université de Montréal) |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/30414/ |
| Conference Title: | 1997 IEEE Instrumentation & Measurement Technology Conference, IMTC |
| Conference Location: | Ottawa, Can |
| Conference Date(s): | 1997-05-19 - 1997-05-21 |
| Publisher: | IEEE |
| DOI: | 10.1109/imtc.1997.604035 |
| Official URL: | https://doi.org/10.1109/imtc.1997.604035 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 08 Apr 2025 02:21 |
| Cite in APA 7: | Hammache, A., Brassard, G., Bouchard, M. A., Beauregard, F., Akyel, C., & Ghannouchi, F. M. (1997, May). Thermal characterization of MESFETs using I-V pulsed and DC measurements [Paper]. 1997 IEEE Instrumentation & Measurement Technology Conference, IMTC, Ottawa, Can. https://doi.org/10.1109/imtc.1997.604035 |
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