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Thermal characterization of MESFETs using I-V pulsed and DC measurements

A. Hammache, G. Brassard, Michel A. Bouchard, F. Beauregard, Cevdet Akyel and Fadhel M. Ghannouchi

Paper (1997)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique;
Nom historique du département: Département de géologie (Université de Montréal)
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/30414/
Conference Title: 1997 IEEE Instrumentation & Measurement Technology Conference, IMTC
Conference Location: Ottawa, Can
Conference Date(s): 1997-05-19 - 1997-05-21
Publisher: IEEE
DOI: 10.1109/imtc.1997.604035
Official URL: https://doi.org/10.1109/imtc.1997.604035
Date Deposited: 18 Apr 2023 15:23
Last Modified: 25 Sep 2024 16:12
Cite in APA 7: Hammache, A., Brassard, G., Bouchard, M. A., Beauregard, F., Akyel, C., & Ghannouchi, F. M. (1997, May). Thermal characterization of MESFETs using I-V pulsed and DC measurements [Paper]. 1997 IEEE Instrumentation & Measurement Technology Conference, IMTC, Ottawa, Can. https://doi.org/10.1109/imtc.1997.604035

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