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Joint design and test consideration in high frequency circuits

Iboun-Taimiya Sylla, Mustapha Slamani, Bozena Kaminska and Fadhel M. Ghannouchi

Article (1997)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/30042/
Journal Title: Microwave and Optical Technology Letters (vol. 16, no. 3)
Publisher: Wiley
DOI: 10.1002/(sici)1098-2760(19971020)16:3<132::aid-mop2>3.0.co;2-n
Official URL: https://doi.org/10.1002/%28sici%291098-2760%281997...
Date Deposited: 18 Apr 2023 15:23
Last Modified: 05 Apr 2024 11:19
Cite in APA 7: Sylla, I.-T., Slamani, M., Kaminska, B., & Ghannouchi, F. M. (1997). Joint design and test consideration in high frequency circuits. Microwave and Optical Technology Letters, 16(3), 132-138. https://doi.org/10.1002/%28sici%291098-2760%2819971020%2916%3a3%3c132%3a%3aaid-mop2%3e3.0.co%3b2-n



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