Iboun-Taimiya Sylla, Mustapha Slamani, Bozena Kaminska and Fadhel M. Ghannouchi
Article (1997)
An external link is available for this itemAdditional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
---|---|
Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
PolyPublie URL: | https://publications.polymtl.ca/30042/ |
Journal Title: | Microwave and Optical Technology Letters (vol. 16, no. 3) |
Publisher: | Wiley |
DOI: | 10.1002/(sici)1098-2760(19971020)16:3<132::aid-mop2>3.0.co;2-n |
Official URL: | https://doi.org/10.1002/%28sici%291098-2760%281997... |
Date Deposited: | 18 Apr 2023 15:23 |
Last Modified: | 25 Sep 2024 16:11 |
Cite in APA 7: | Sylla, I.-T., Slamani, M., Kaminska, B., & Ghannouchi, F. M. (1997). Joint design and test consideration in high frequency circuits. Microwave and Optical Technology Letters, 16(3), 132-138. https://doi.org/10.1002/%28sici%291098-2760%2819971020%2916%3a3%3c132%3a%3aaid-mop2%3e3.0.co%3b2-n |
---|---|
Statistics
Dimensions