D. Popovici, K. Piyakis, Michel Meunier
and Edward Sacher
Article (1998)
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| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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| Department: | Department of Engineering Physics |
| Research Center: | GCM - Thin Film Physics and Technology Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/29404/ |
| Journal Title: | Journal of Applied Physics (vol. 83, no. 1) |
| Publisher: | American Institute of Physics |
| DOI: | 10.1063/1.366706 |
| Official URL: | https://doi.org/10.1063/1.366706 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 25 Sep 2024 16:10 |
| Cite in APA 7: | Popovici, D., Piyakis, K., Meunier, M., & Sacher, E. (1998). Angle-resolved x-ray photoelectron spectroscopy comparison of copper/Teflon AF1600 and aluminum/Kapton metal diffusion. Journal of Applied Physics, 83(1), 108-111. https://doi.org/10.1063/1.366706 |
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