Simultaneous Analysis of Current-Voltage and Capacitance- Voltage Characteristics of Metal-Insulator-Semiconductor Diodes With a High Mid-Gap Trap Density

P. Cova, A. Singh and Rémo A. Masut

Article (1999)

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Additional Information:	Nom historique du département: Département de génie physique et de génie des matériaux
Department:	Department of Engineering Physics
Research Center:	GCM - Thin Film Physics and Technology Research Group
PolyPublie URL:	https://publications.polymtl.ca/29022/
Journal Title:	Journal of Applied Physics (vol. 85, no. 9)
Publisher:	American Institute of Physics
DOI:	10.1063/1.370157
Official URL:	https://doi.org/10.1063/1.370157
Date Deposited:	18 Apr 2023 15:22
Last Modified:	25 Sep 2024 16:10

Cite in APA 7:	Cova, P., Singh, A., & Masut, R. A. (1999). Simultaneous Analysis of Current-Voltage and Capacitance- Voltage Characteristics of Metal-Insulator-Semiconductor Diodes With a High Mid-Gap Trap Density. Journal of Applied Physics, 85(9), 6530-6538. https://doi.org/10.1063/1.370157
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