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Simultaneous Analysis of Current-Voltage and Capacitance- Voltage Characteristics of Metal-Insulator-Semiconductor Diodes With a High Mid-Gap Trap Density

P. Cova, A. Singh and Rémo A. Masut

Article (1999)

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Additional Information: Nom historique du département: Département de génie physique et de génie des matériaux
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/29022/
Journal Title: Journal of Applied Physics (vol. 85, no. 9)
Publisher: American Institute of Physics
DOI: 10.1063/1.370157
Official URL: https://doi.org/10.1063/1.370157
Date Deposited: 18 Apr 2023 15:22
Last Modified: 05 Apr 2024 11:17
Cite in APA 7: Cova, P., Singh, A., & Masut, R. A. (1999). Simultaneous Analysis of Current-Voltage and Capacitance- Voltage Characteristics of Metal-Insulator-Semiconductor Diodes With a High Mid-Gap Trap Density. Journal of Applied Physics, 85(9), 6530-6538. https://doi.org/10.1063/1.370157

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