X. Y. Zeng, S. J. Xu, T. Yoneyama, K. M. Luk and Ke Wu
Article (1999)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/28456/ |
| Journal Title: | International Journal of Infrared and Millimeter Waves (vol. 20, no. 3) |
| Publisher: | Kluwer Academic Publishers |
| DOI: | 10.1023/a:1021777718054 |
| Official URL: | https://doi.org/10.1023/a%3a1021777718054 |
| Date Deposited: | 18 Apr 2023 15:22 |
| Last Modified: | 08 Apr 2025 02:18 |
| Cite in APA 7: | Zeng, X. Y., Xu, S. J., Yoneyama, T., Luk, K. M., & Wu, K. (1999). Systematic investigation on leaky characteristics for NRD guide with arbitrary profile of cross-section. International Journal of Infrared and Millimeter Waves, 20(3), 491-503. https://doi.org/10.1023/a%3a1021777718054 |
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