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Temperature Distribution Over a Gaas Heterojunction Bipolar Transistor Measured by Fluorescent Microthermal Imaging

N. Boyer, B. Oliver, A. Hagley, D. P. Masson, Martine Simard-Normandin and Michel Meunier

Article (2000)

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Additional Information: Nom historique du département: Département de génie physique et de génie des matériaux
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/28321/
Journal Title: Journal of vacuum science and technology. A, Vacuum, surfaces, and films (vol. 18, no. 2)
Publisher: American Vacuum Society
DOI: 10.1116/1.582173
Official URL: https://doi.org/10.1116/1.582173
Date Deposited: 18 Apr 2023 15:21
Last Modified: 05 Apr 2024 11:16
Cite in APA 7: Boyer, N., Oliver, B., Hagley, A., Masson, D. P., Simard-Normandin, M., & Meunier, M. (2000). Temperature Distribution Over a Gaas Heterojunction Bipolar Transistor Measured by Fluorescent Microthermal Imaging. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 18(2), 754-756. https://doi.org/10.1116/1.582173

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