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Boyer, N., Oliver, B., Hagley, A., Masson, D. P., Simard-Normandin, M., & Meunier, M. (2000). Temperature Distribution Over a Gaas Heterojunction Bipolar Transistor Measured by Fluorescent Microthermal Imaging. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 18(2), 754-756. Lien externe
Boyer, N., Masson, D. P., Meunier, M., & Simard-Normandin, M. (mars 1999). FMI applied to the study of the temperature distribution in flip chips [Communication écrite]. 15th IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM 1999), San Diego, CA, USA. Lien externe
