Alexis Lefèvre, Laurent J. Lewis, Ludvik Martinu
and Michael R. Wertheimer
Article (2001)
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| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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| Department: | Department of Engineering Physics |
| Research Center: | GCM - Thin Film Physics and Technology Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/27254/ |
| Journal Title: | Physical Review B (vol. 64, no. 11) |
| Publisher: | American Physical Society |
| DOI: | 10.1103/physrevb.64.115429 |
| Official URL: | https://doi.org/10.1103/physrevb.64.115429 |
| Date Deposited: | 18 Apr 2023 15:21 |
| Last Modified: | 25 Sep 2024 16:08 |
| Cite in APA 7: | Lefèvre, A., Lewis, L. J., Martinu, L., & Wertheimer, M. R. (2001). Structural Properties of Silicon Dioxide Thin Films Densified by Medium-Energy Particles. Physical Review B, 64(11), 115429-115429. https://doi.org/10.1103/physrevb.64.115429 |
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