Arthur Yelon, Alain Rochefort
, S. Sheng and Edward Sacher
Article (2003)
An external link is available for this item| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/25390/ |
| Journal Title: | Solar Energy Materials and Solar Cells (vol. 78, no. 1-4) |
| Publisher: | Elsevier |
| DOI: | 10.1016/s0927-0248(02)00444-0 |
| Official URL: | https://doi.org/10.1016/s0927-0248%2802%2900444-0 |
| Date Deposited: | 18 Apr 2023 15:20 |
| Last Modified: | 08 Apr 2025 02:14 |
| Cite in APA 7: | Yelon, A., Rochefort, A., Sheng, S., & Sacher, E. (2003). Irradiation-induced structural changes in hydrogenated amorphous silicon as measured by X-ray photoemission spectroscopy. Solar Energy Materials and Solar Cells, 78(1-4), 391-398. https://doi.org/10.1016/s0927-0248%2802%2900444-0 |
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