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Sheng, S., Sacher, E., & Yelon, A. (avril 2000). X-ray photoemission spectroscopic study of light-induced structural changes in amorphous silicon [Communication écrite]. Amorphous and Heterogeneous Silicon Thin Films - 2000. Symposium, San Francisco, CA, USA. Lien externe
Yelon, A., Rochefort, A., Sheng, S., & Sacher, E. (2003). Irradiation-induced structural changes in hydrogenated amorphous silicon as measured by X-ray photoemission spectroscopy. Solar Energy Materials and Solar Cells, 78(1-4), 391-398. Lien externe
