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Items where Author is "Sheng, S."

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Sheng, S., Sacher, E., & Yelon, A. (2000, April). X-ray photoemission spectroscopic study of light-induced structural changes in amorphous silicon [Paper]. Amorphous and Heterogeneous Silicon Thin Films - 2000. Symposium, San Francisco, CA, USA. External link


Yelon, A., Rochefort, A., Sheng, S., & Sacher, E. (2003). Irradiation-induced structural changes in hydrogenated amorphous silicon as measured by X-ray photoemission spectroscopy. Solar Energy Materials and Solar Cells, 78(1-4), 391-398. External link

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