S. Hashemi, Mohamad Sawan
and Yvon Savaria
Paper (2004)
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| Department: | Department of Electrical Engineering |
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| Research Center: | Polystim - Neurotechnology Laboratory |
| ISBN: | 0780383222 |
| PolyPublie URL: | https://publications.polymtl.ca/24984/ |
| Conference Title: | 2nd Annual IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2004) |
| Conference Location: | Montréal, Québec |
| Conference Date(s): | 2004-06-20 - 2004-06-23 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/newcas.2004.1359098 |
| Official URL: | https://doi.org/10.1109/newcas.2004.1359098 |
| Date Deposited: | 18 Apr 2023 15:19 |
| Last Modified: | 27 Sep 2024 14:48 |
| Cite in APA 7: | Hashemi, S., Sawan, M., & Savaria, Y. (2004, June). Characterization of Stress Induced Defects in Deep Sub-Micron MOSFETS [Paper]. 2nd Annual IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2004), Montréal, Québec. https://doi.org/10.1109/newcas.2004.1359098 |
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