Numerical through-resistor (TR) calibration technique for modeling of microwave integrated circuits

Lin Li and Ke Wu

Article (2004)

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Department:	Department of Electrical Engineering
Research Center:	POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics
PolyPublie URL:	https://publications.polymtl.ca/24848/
Journal Title:	IEEE Microwave and Wireless Components Letters (vol. 14, no. 4)
Publisher:	IEEE
DOI:	10.1109/lmwc.2003.819375
Official URL:	https://doi.org/10.1109/lmwc.2003.819375
Date Deposited:	18 Apr 2023 15:19
Last Modified:	08 Apr 2025 02:13

Cite in APA 7:	Li, L., & Wu, K. (2004). Numerical through-resistor (TR) calibration technique for modeling of microwave integrated circuits. IEEE Microwave and Wireless Components Letters, 14(4), 139-141. https://doi.org/10.1109/lmwc.2003.819375
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