Article (2005)
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| Department: | Department of Electrical Engineering |
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| Research Center: | POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics |
| PolyPublie URL: | https://publications.polymtl.ca/23932/ |
| Journal Title: | IEEE Microwave and Wireless Components Letters (vol. 15, no. 12) |
| Publisher: | IEEE |
| DOI: | 10.1109/lmwc.2005.859978 |
| Official URL: | https://doi.org/10.1109/lmwc.2005.859978 |
| Date Deposited: | 18 Apr 2023 15:18 |
| Last Modified: | 25 Sep 2024 16:03 |
| Cite in APA 7: | Li, L., & Wu, K. (2005). Multiport through-resistor (TR) numerical calibration. IEEE Microwave and Wireless Components Letters, 15(12), 883-885. https://doi.org/10.1109/lmwc.2005.859978 |
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