Aziz Berchtikou, Joel Lavoie, Viorel Poenariu, Bachir Saoudi, Raman Kashyap and Michael R. Wertheimer
Article (2011)
An external link is available for this itemDepartment: |
Department of Electrical Engineering Department of Engineering Physics |
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Research Center: | GR2M - Microelectronics and Microsystems Research Group |
PolyPublie URL: | https://publications.polymtl.ca/17221/ |
Journal Title: | IEEE Transactions on Dielectrics and Electrical Insulation (vol. 18, no. 1) |
Publisher: | IEEE |
DOI: | 10.1109/tdei.2011.5704489 |
Official URL: | https://doi.org/10.1109/tdei.2011.5704489 |
Date Deposited: | 18 Apr 2023 15:11 |
Last Modified: | 25 Sep 2024 15:54 |
Cite in APA 7: | Berchtikou, A., Lavoie, J., Poenariu, V., Saoudi, B., Kashyap, R., & Wertheimer, M. R. (2011). Thermometry in noble gas dielectric barrier discharges at atmospheric pressure using optical emission spectroscopy. IEEE Transactions on Dielectrics and Electrical Insulation, 18(1), 24-33. https://doi.org/10.1109/tdei.2011.5704489 |
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