Étienne Boulais, J. Fantoni, A. Chateauneuf, Yvon Savaria
and Michel Meunier
Article (2011)
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| Department: |
Department of Engineering Physics Department of Electrical Engineering |
|---|---|
| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/17164/ |
| Journal Title: | IEEE Transactions on Electron Devices (vol. 58, no. 2) |
| Publisher: | IEEE |
| DOI: | 10.1109/ted.2010.2093770 |
| Official URL: | https://doi.org/10.1109/ted.2010.2093770 |
| Date Deposited: | 18 Apr 2023 15:11 |
| Last Modified: | 08 Apr 2025 01:44 |
| Cite in APA 7: | Boulais, É., Fantoni, J., Chateauneuf, A., Savaria, Y., & Meunier, M. (2011). Laser-induced resistance fine tuning of integrated polysilicon thin-film resistors. IEEE Transactions on Electron Devices, 58(2), 572-575. https://doi.org/10.1109/ted.2010.2093770 |
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