Zaid Al-Bayati, O. Ait Mohamed, Yvon Savaria
and Mounir Boukadoum
Paper (2012)
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| Department: | Department of Electrical Engineering |
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| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/15911/ |
| Conference Title: | 10th IEEE International New Circuits and Systems Conference (NEWCAS 2012) |
| Conference Location: | Montréal, Québec |
| Conference Date(s): | 2012-06-17 - 2012-06-20 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/newcas.2012.6328989 |
| Official URL: | https://doi.org/10.1109/newcas.2012.6328989 |
| Date Deposited: | 18 Apr 2023 15:10 |
| Last Modified: | 08 Apr 2025 12:19 |
| Cite in APA 7: | Al-Bayati, Z., Ait Mohamed, O., Savaria, Y., & Boukadoum, M. (2012, June). Probabilistic model checking of clock domain crossing interfaces [Paper]. 10th IEEE International New Circuits and Systems Conference (NEWCAS 2012), Montréal, Québec. https://doi.org/10.1109/newcas.2012.6328989 |
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