Helgi S. Skulason, Hoang V. Nguyen, A. Guermoune, M. Siaj, Christophe Caloz and Thomas Szkopek
Paper (2012)
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| Department: | Department of Electrical Engineering |
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| Research Center: | POLY-GRAMES - Advanced Research Centre in Microwaves and Space Electronics |
| PolyPublie URL: | https://publications.polymtl.ca/14603/ |
| Conference Title: | IEEE MTT-S International Microwave Symposium (IMS 2012) |
| Conference Location: | Montréal, Québec |
| Conference Date(s): | 2012-06-17 - 2012-06-22 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/mwsym.2012.6259711 |
| Official URL: | https://doi.org/10.1109/mwsym.2012.6259711 |
| Date Deposited: | 18 Apr 2023 15:11 |
| Last Modified: | 25 Sep 2024 15:51 |
| Cite in APA 7: | Skulason, H. S., Nguyen, H. V., Guermoune, A., Siaj, M., Caloz, C., & Szkopek, T. (2012, June). Contactless impedance measurement of large-area high-quality graphene [Paper]. IEEE MTT-S International Microwave Symposium (IMS 2012), Montréal, Québec. https://doi.org/10.1109/mwsym.2012.6259711 |
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