Soroush Hafezian, Bill Baloukas and Ludvik Martinu
Article (2014)
An external link is available for this item| Department: | Department of Engineering Physics |
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| Research Center: | LaRFIS - Functional Coating and Surface Engineering Laboratory |
| PolyPublie URL: | https://publications.polymtl.ca/12229/ |
| Journal Title: | Applied Optics (vol. 53, no. 24) |
| Publisher: | Optical Society of America (OSA) |
| DOI: | 10.1364/ao.53.005367 |
| Official URL: | https://doi.org/10.1364/ao.53.005367 |
| Date Deposited: | 18 Apr 2023 15:08 |
| Last Modified: | 08 Apr 2025 01:39 |
| Cite in APA 7: | Hafezian, S., Baloukas, B., & Martinu, L. (2014). Percolation threshold determination of sputtered silver films using Stokes parameters and in situ conductance measurements. Applied Optics, 53(24), 5367-5374. https://doi.org/10.1364/ao.53.005367 |
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