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Andelic, M., Pofelski, A., Assali, S., Koelling, S., Luo, L., Moutanabbir, O., & Botton, G. A. (2022). Structural and Chemical Characterization of Ge/GeSn Core/Shell Nanowires. Microscopy and Microanalysis, 28(S1), 2430-2431. Lien externe
Assali, S., Attiaoui, A., Koelling, S., Atalla, M. R. M., Kumar, A., Nicolas, J., Chowdhury, F. A., Lemieux-Leduc, C., & Moutanabbir, O. (2022). Micrometer-thick, atomically random Si0.06Ge0.90Sn0.04 for silicon-integrated infrared optoelectronics. Journal of Applied Physics, 132(19), 11 pages. Lien externe
Assali, S., Koelling, S., Abboud, Z., Nicolas, J., Attiaoui, A., & Moutanabbir, O. (2022). 500-period epitaxial Ge/Si0.18Ge0.82 multi-quantum wells on silicon. Journal of Applied Physics, 132(17), 175304 (9 pages). Lien externe
