Documents publiés en "2020"

Département de génie électrique

Hasib, O. A.-T., Savaria, Y., & Thibeault, C. (2020). Multi-PVT-Point Analysis and Comparison of Recent Small-Delay Defect Quality Metrics. Journal of Electronic Testing-Theory and Applications, 35(6), 823-838. Lien externe

Hasib, O. A.-T., Savaria, Y., & Thibeault, C. (2020). Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 28(3), 764-776. Lien externe