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Abubakr, A., Hassan, A., Ragab, A., Yacout, S., Savaria, Y., & Sawan, M. (mai 2018). High-temperature modeling of the I-V characteristics of GaN150 HEMT using machine learning techniques [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2018), Florence, Italie (5 pages). Lien externe
Amer, M., Hassan, A., Ragab, A., Yacout, S., Savaria, Y., & Sawan, M. (mai 2018). High-Temperature Empirical Modeling for the I-V Characteristics of GaN150-Based HEMT [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2018), Florence, Italy. Lien externe
Abubakr, A., Hassan, A., Ragab, A., Yacout, S., Savaria, Y., & Sawan, M. (mai 2018). High-temperature modeling of the I-V characteristics of GaN150 HEMT using machine learning techniques [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2018), Florence, Italie (5 pages). Lien externe
Alizadeh, E., Koujok, M. E., Ragab, A., & Amazouz, M. (août 2018). A Data-Driven Causality Analysis Tool for Fault Diagnosis in Industrial Processes [Communication écrite]. 10th IFAC Symposium on Fault Detection, Supervision and Safety for Technical Processes (SAFEPROCESS 2018), Warsaw, Poland. Publié dans IFAC-PapersOnLine, 51(24). Lien externe
Amer, M., Hassan, A., Ragab, A., Yacout, S., Savaria, Y., & Sawan, M. (mai 2018). High-Temperature Empirical Modeling for the I-V Characteristics of GaN150-Based HEMT [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2018), Florence, Italy. Lien externe
Ragab, A., El-Koujok, M., Poulin, B., Amazouz, M., & Yacout, S. (2018). Fault diagnosis in industrial chemical processes using interpretable patterns based on logical analysis of data. Expert Systems With Applications, 95, 368-383. Lien externe