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Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (décembre 2018). Reliability Analysis of the SPARC V8 Architecture via Fault Trees and UPPAL-SMC [Communication écrite]. 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2018), Bordeaux, France. Lien externe
Bany Hamad, G., Ammar, M., Mohamed, O. A., & Savaria, Y. (septembre 2018). System-Level Characterization, Modeling, and Probabilistic Formal Analysis of LEON3 Vulnerability to Transient Faults [Communication écrite]. 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2018), Piscataway, NJ, USA (4 pages). Lien externe
