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Jay, A., Raine, M., Richard, N., Mousseau, N., Goiffon, V., Hémeryck, A., & Magna, P. (2017). Simulation of Single Particle Displacement Damage in Silicon-Part II: Generation and Long-Time Relaxation of Damage Structure. IEEE Transactions on Nuclear Science, 64(1), 141-148. Lien externe
Salles, N., Richard, N., Mousseau, N., & Hémeryck, A. (2017). Strain-driven diffusion process during silicon oxidation investigated by coupling density functional theory and activation relaxation technique. Journal of Chemical Physics, 147(5), 054701 (9 pages). Lien externe
