Documents publiés en "2015"

Département de génie électrique

Hamad, G. B., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2015). Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits. Microelectronics Reliability, 55(1), 238-250. Lien externe

Hamad, G. B., Mohamed, O. A., & Savaria, Y. (juillet 2015). Efficient Multilevel Formal Analysis and Estimation of Design Vulnerability to Single Event Transients [Communication écrite]. 21st International On-Line Testing Symposium (IOLTS 2015), Athena Pallas, Greece (6 pages). Lien externe