 | Monter d'un niveau |
Bany Hamad, G., Hasan, S. R., Mohamed, O. A.̈., & Savaria, Y. (juin 2014). Abstracting Single Event Transient characteristics variations due to input patterns and fan-out [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2014), Melbourne, VIC, Australia (4 pages). Lien externe
Bany Hamad, G., Hasan, S. R., Mohamed, O. A.̈., & Savaria, Y. (août 2014). Modeling, analyzing, and abstracting single event transient propagation at gate level [Communication écrite]. IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS 2014), College Station, TX, USA. Lien externe
Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (décembre 2014). Probabilistic model checking of single event transient propagation at RTL level [Communication écrite]. 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS 2014), Marseille, France. Lien externe
Hoque, K. A., Mohamed, O. A.̈., Savaria, Y., & Thibeault, C. (octobre 2014). Probabilistic model checking based DAL analysis to optimize a combined TMR-blind-scrubbing mitigation technique for FPGA-based aerospace applications [Communication écrite]. 12th ACM/IEEE International Conference on Methods and Models for System Design (MEMOCODE 2014), Lausanne, Switzerland. Lien externe
