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Bettayeb, B., & Bassetto, S. (mars 2014). Effects of process learning and product lifecycle on risk-based quality control plans [Communication écrite]. 8th annual IEEE International Systems Conference on Systems Conference (SysCon 2014), Ottawa, ON. Lien externe
Bettayeb, B., Bassetto, S., & Sahnoun, M. (2014). Quality control planning to prevent excessive scrap production. Journal of Manufacturing Systems, 33(3), 400-411. Lien externe
Fiegenwald, V., Bassetto, S., & Tollenaere, M. (2014). Controlling non-conformities propagation in manufacturing. International Journal of Production Research, 52(14), 4118-4131. Lien externe
Nebas, M., & Bassetto, S. (juillet 2014). Data management system in clean room environment [Communication écrite]. 2nd annual MIT App Inventor Summit, Boston, MA. Non disponible
Pourmonet, H., Charron-Latour, J., & Bassetto, S. (juillet 2014). App inventor to boost continuous improvement [Communication écrite]. 2nd annual MIT App Inventor Summit, Boston, MA. Non disponible
Sahnoun, M. , Bettayeb, B., Bassetto, S., & Tollenaere, M. (2014). Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. Journal of Intelligent Manufacturing, 27(6), 1335-1349. Lien externe
Tilouche, S., Bassetto, S., & Partovi Nia, V. (septembre 2014). Classification algorithms for virtual metrology [Communication écrite]. IEEE International Conference on Management of Innovation and Technology (ICMIT 2014), Singapore, Singapore. Lien externe
