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Documents publiés en "2013"

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Nombre de documents: 7

Département de génie physique

Choubak, S., Biron, M., Levesque, P. L., Martel, R., & Desjardins, P. (2013). No graphene etching in purified hydrogen. Journal of Physical Chemistry Letters, 4(7), 1100-1103. Lien externe

Fournier-Lupien, J.-H., Mukherjee, S., Wirths, S., Pippel, E., Hayazawa, N., Mussler, G., Hartmann, J. M., Desjardins, P., Buca, D., & Moutanabbir, O. (2013). Strain and composition effects on Raman vibrational modes of silicon-germanium-tin ternary alloys. Applied Physics Letters, 103(26). Lien externe

Gaudet, S., De Keyser, K., Lambert-Milot, S., Jordan-Sweet, J., Detavernier, C., Lavoie, C., & Desjardins, P. (2013). Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 31(2). Lien externe

Ghafoor, N., Johnson, L. J. S., Klenov, D. O., Demeulemeester, J., Desjardins, P., Petrov, I., Hultman, L., & Oden, M. (2013). Nanolabyrinthine ZrAlN thin films by self-organization of interwoven single-crystal cubic and hexagonal phases. APL Materials, 1(2), 6 pages. Lien externe

Lacroix, C., Lambert-Milot, S., Masut, R. A., Desjardins, P., & Ménard, D. (2013). Ferromagnetic resonance measurements of GaP epilayers with embedded MnP nanoclusters grown on GaP(001). Physical Review B, 87(2), 024412 (10 pages). Lien externe

Simoneau, L.-P., Villeneuve, J., Aguirre, C. M., Martel, R., Desjardins, P., & Rochefort, A. (2013). Influence of statistical distributions on the electrical properties of disordered and aligned carbon nanotube networks. Journal of Applied Physics, 114(11), 8-8. Lien externe

Turcotte-Tremblay, P., Guihard, M., Gaudet, S., Chicoine, M., Lavoie, C., Desjardins, P., & Schiettekatte, F. (2013). Thin film Ni-Si solid-state reactions: Phase formation sequence on amorphized Si. Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 31(5). Lien externe

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