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Moutanabbir, O., Reiche, M., Hähnel, A., Erfurth, W., Tarun, A., Hayazawa, N., Kawata, S., Naumann, F., & Petzold, M. (2010). Strain Stability in Nanoscale Patterned Strained Silicon-On-Insulator. ECS Transactions, 33(6), 511-522. Lien externe
Moutanabbir, O., Reiche, M., Zakharov, N., Naumann, F., & Petzold, M. (2010). Observation of free surface-induced bending upon nanopatterning of ultrathin strained silicon layer. Nanotechnology, 22(4), 045701 (5 pages). Lien externe
