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Abderrahman, A., Savaria, Y., Khouas, A., & Sawan, M. (août 2007). Accurate testability analysis based-on multi-frequency test generation and a new testability metric [Communication écrite]. IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2007), Montréal, Québec. Lien externe
Abderrahman, A., Savaria, Y., Khouas, A., & Sawan, M. (décembre 2007). New Analog Test Metrics Based on Probabilistic and Deterministic Combination Approaches [Communication écrite]. 14th IEEE International Conference on Electronics, Circuits and Systems, Marrakech, Morocco. Lien externe
Amiri, A. M., Khouas, A., & Boukadoum, M. (mai 2007). On the timing uncertainty in delay-line-based time measurement applications targeting FPGAs [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2007), New Orleans, Louisiana. Lien externe
