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Gaidi, M., Stafford, L., Amassian, A., Chaker, M., Margot, J., Martinu, L., & Kulishov, M. (2005). Influence of the Microstructure on the Optical Characteristics of SrTiO₃ Thin Films. Journal of Materials Research, 20(1), 68-74. Lien externe
Jedrzejowski, P., Amassian, A., Bousser, E., Martinu, L., & Sapieha, J.-E. (avril 2005). Growth study of TiN and superhard nanocompostie c-TiN/Si₃N₄ and c-TiCN/a-SiCN coatings using in situ ellipsometry [Communication écrite]. 48th Society of Vacuum Coaters Technical Conference, Denver, Colorado. Non disponible
Kaminska, K., Amassian, A., Martinu, L., & Robbie, K. (2005). Growth of vacuum evaporated ultraporous silicon studied with spectroscopic ellipsometry and scanning electron microscopy. Journal of Applied Physics, 97(1). Lien externe
Tabbal, M., Christidis, T., Isber, S., Merel, P., El-Khakani, M. A., Chaker, M., Amassian, A., & Martinu, L. (2005). Correlation between the sp²-phase nanostructure and the physical properties of unhydrogenated carbon nitride. Journal of Applied Physics, 98(4). Lien externe
