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Boudjella, A., Jin, Z.-F., & Savaria, Y. (2003, October). Electrical field analysis of nanoscaled field effect transistors [Paper]. International Microprocesses and Nanotechnology Conference, Tokyo, Japan. External link
Jin, Z.-F., Laurin, J.-J., & Savaria, Y. Comparison of Propagation Characteristics Between Single and Coupled Mis Interconnect Topologies in Vlsi Circuits [Paper]. Canadian Conference on Electrical and Computer Engineering (CCECE 2003). External link
