 | Monter d'un niveau |
Boudjella, A., Jin, Z.-F., & Savaria, Y. (octobre 2003). Electrical field analysis of nanoscaled field effect transistors [Communication écrite]. International Microprocesses and Nanotechnology Conference, Tokyo, Japan. Lien externe
Jin, Z.-F., Laurin, J.-J., & Savaria, Y. Comparison of Propagation Characteristics Between Single and Coupled Mis Interconnect Topologies in Vlsi Circuits [Communication écrite]. Canadian Conference on Electrical and Computer Engineering (CCECE 2003). Lien externe
