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Degorce, J.-Y., Saucier, A., & Meunier, M. (juin 2002). A simple analytical method for the characterization of the melt region of a semiconductor under focused laser irradiation [Communication écrite]. European Materials Research Society conference on Physics and Chemistry of Advanced Laser Materials Processing, Strasbourg, France. Publié dans Applied Surface Science, 208-209. Lien externe
Meunier, M., Ducharme, M., Degorce, J.-Y., Liao, Y., & Lacourse, A. (septembre 2002). Laser Induced Local Modification of Silicon Microdevices: a New Technique for Tuning Analogue Microelectronics [Communication écrite]. International Conference on Advanced Laser Technologies (ALT 2002), Adelboden, Switzerland. Lien externe
