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Sheng, S., Sacher, E., & Yelon, A. (2001). Structural Changes in Amorphous Silicon Studied by X-Ray Photoemission Spectroscopy: a Phenomenon Independent of the Staebler-Wronski Effect? Journal of Non-Crystalline Solids, 282(2-3), 165-172. Lien externe
Sheng, S., Sacher, E., & Yelon, A. (avril 2000). X-ray photoemission spectroscopic study of light-induced structural changes in amorphous silicon [Communication écrite]. Amorphous and Heterogeneous Silicon Thin Films - 2000. Symposium, San Francisco, CA, USA. Lien externe
