Monter d'un niveau |
Lefèvre, A., Lewis, L. J., Martinu, L., & Wertheimer, M. R. (2001). Structural Properties of Silicon Dioxide Thin Films Densified by Medium-Energy Particles. Physical Review B, 64(11), 115429-115429. Lien externe
Malek, R., Mousseau, N., & Barkema, G. T. (avril 2001). Characterization of the Activation-Relaxation Technique : Recent Results on Models of Amorphous Silicon [Communication écrite]. Symposium AA: Advances in Materials Theory and Modeling-Bridging Over Multiple-Length and Time Scales, San Francisco, Calif.. Lien externe
Bulatov, V., Colombo, L., Cléri, F., Lewis, L. J., & Mousseau, N. (édit.) (2001). Advances in materials theory and modeling: bridging over multiple length and time scale. Lien externe