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Gagnon, Y., Savaria, Y., Meunier, M., & Thibeault, C. (octobre 1997). Are defect-tolerant circuits with redundancy really cost-effective? Complete and realistic cost model [Communication écrite]. IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (DFT 1997), Paris, Fr. Lien externe
Kafrounni, M., Thibeault, C., & Savaria, Y. (octobre 1997). Cost model for VLSI/MCM systems [Communication écrite]. IEEE Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, France. Lien externe
