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Arabi, K., Kaminska, B., & Rzeszut, J. (novembre 1994). Built-in self-test approach for medium to high-resolution digital-to-analog converters [Communication écrite]. 3rd Asian Test Symposium, Nara, Japon. Lien externe
Arabi, K., Kaminska, B., & Rzeszut, J. (novembre 1994). New built-in self-test approach for digital-to-analog and analog-to-digital converters [Communication écrite]. IEEE/ACM International Conference on Computer-Aided Design, San Jose, CA, USA. Publié dans IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. Lien externe
