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Crépeau, J., Thibeault, C., & Savaria, Y. (octobre 1993). Some results on yield and local design rule relaxation [Communication écrite]. IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (DFT 1993), Venice, Italy. Lien externe
Savaria, Y., & Thibeault, C. (août 1993). An inexpensive method of detecting localised parametric defects in static RAM [Communication écrite]. IEEE International Workshop on Memory Testing (MT 1993), San Jose, CA, United states. Lien externe
